Li, holding her best paper award plaque from Microscopy and Microanalysis for the first paper on electron correlation microscopy (ECM).
Xuying Liu has joined the group as a new graduate student working on defects in SiC, including in situ nanoindentation. She’s joining us from the University of Illinois, Urbana-Champaign. We’re glad to have her – welcome!
Debaditya Chatterjee has joined the group as a new graduate student working on fluctuation electron microscopy. He’s joining us from the Indian Institute of Science in Bangalore. We’re glad to have him – welcome!
Chenyu and Andy have published a paper in Nanotechnology applying advanced methods in data science to STEM EDS spectrum images. They built on our past work using non-rigid registration and incorporated a new method for denoising called non-local principle component analysis. The combination of the two makes for a significant improvement in the data quality for STEM EDS at atomic resolution.
A paper containing some beautiful microanalysis results on patterned magnetic tunnel junctions by Congli has been published in Nanotechnology.
Li has published a paper in PRB describing radiation-induced mobility of defect clusters in SiC observed using high-resolution low-angle dark-field STEM. Congratulations, Li!
Two pictures from the recent group outing to Governor Dodge State Park. The first one is the entire group, including family members, at the cookout. The second one is the more intrepid group half way along the Lost Canyon Trail at Sheperd’s Falls. Thanks for Jie and Dan for organizing.
Jason won a poster award at the BMG XI, the 11th International Conference on Bulk Metallic Glasses for his poster “Medium-Range Structure of Zr-Cu-Al Bulk Metallic Glasses from Structure Optimization Based on Fluctuation Microscopy”. Congratulations, Jason!
Li and Pei’s paper on electron correlation microscopy has won the Best Techniques and Instrumentation Paper in the journal Microscopy and Microanalysis for 2016. Congratulations to Li and Pei for this well-deserved recognition of their excellent work!