Li, holding her best paper award plaque from Microscopy and Microanalysis for the first paper on electron correlation microscopy (ECM).
Month: August 2016
Welcome new student Xuying Liu
Xuying Liu has joined the group as a new graduate student working on defects in SiC, including in situ nanoindentation. She’s joining us from the University of Illinois, Urbana-Champaign. We’re glad to have her – welcome!
Welcome new student Debaditya Chatterjee
Debaditya Chatterjee has joined the group as a new graduate student working on fluctuation electron microscopy. He’s joining us from the Indian Institute of Science in Bangalore. We’re glad to have him – welcome!
Chenyu and Andy publish on improved methods for EDS spectrum images
Chenyu and Andy have published a paper in Nanotechnology applying advanced methods in data science to STEM EDS spectrum images. They built on our past work using non-rigid registration and incorporated a new method for …
Congli’s paper on patterned MTJs appears
A paper containing some beautiful microanalysis results on patterned magnetic tunnel junctions by Congli has been published in Nanotechnology.