Monthly Archives: August 2016

Li with her Best Paper Award

Li, holding her best paper award plaque from Microscopy and Microanalysis for the first paper on electron correlation microscopy (ECM).

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Welcome new student Xuying Liu

Xuying Liu has joined the group as a new graduate student working on defects in SiC, including in situ nanoindentation. She’s joining us from the University of Illinois, Urbana-Champaign. We’re glad to have her – welcome!

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Welcome new student Debaditya Chatterjee

Debaditya Chatterjee has joined the group as a new graduate student working on fluctuation electron microscopy. He’s joining us from the Indian Institute of Science in Bangalore. We’re glad to have him – welcome!

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Chenyu and Andy publish on improved methods for EDS spectrum images

Chenyu and Andy have published a paper in Nanotechnology applying advanced methods in data science to STEM EDS spectrum images. They built on our past work using non-rigid registration and incorporated a new method for denoising called non-local principle component … Continue reading

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Congli’s paper on patterned MTJs appears

A paper containing some beautiful microanalysis results on patterned magnetic tunnel junctions by Congli has been published in Nanotechnology.

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