Monthly Archives: July 2015

Li’s paper on electron correlation microscopy published

Li’s paper announcing the new electron correlation microscopy technique for measuring relaxation dynamics in materials is now published in Microscopy and Microanalysis.

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Jie Feng wins MSA Presidential Scholar award at M&M 2015

Jie Feng, who is co-advisor by Prof. Voyles and Prof. Morgan of the computational materials group has won a Presidential Scholar Award from the Microscopy Society of America for his work on visualizing single vacancies in LaMnO3 using high-precision STEM.  Congratulations … Continue reading

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New paper on shear bands

Paul has contributed to a new paper using quantitative electron microscopy to measure the density of shear bands that appears this week in Physical Review Letters.  The primary work was done by Vitalij Schmidt, and graduate student with Harald Rosner and … Continue reading

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