Welcome new student Xuying Liu

Xuying Liu has joined the group as a new graduate student working on defects in SiC, including in situ nanoindentation. She’s joining us from the University of Illinois, Urbana-Champaign. We’re glad to have her – welcome!

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Welcome new student Debaditya Chatterjee

Debaditya Chatterjee has joined the group as a new graduate student working on fluctuation electron microscopy. He’s joining us from the Indian Institute of Science in Bangalore. We’re glad to have him – welcome!

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Chenyu and Andy publish on improved methods for EDS spectrum images

Chenyu and Andy have published a paper in Nanotechnology applying advanced methods in data science to STEM EDS spectrum images. They built on our past work using non-rigid registration and incorporated a new method for denoising called non-local principle component analysis. The combination of the two makes for a significant improvement in the data quality for STEM EDS at atomic resolution.

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Congli’s paper on patterned MTJs appears

A paper containing some beautiful microanalysis results on patterned magnetic tunnel junctions by Congli has been published in Nanotechnology.

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Li’s paper on mobile defect clusters in SiC published

Li has published a paper in PRB describing radiation-induced mobility of defect clusters in SiC observed using high-resolution low-angle dark-field STEM. Congratulations, Li!

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Group picnic at Governor Dodge State Park

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Two pictures from the recent group outing to Governor Dodge State Park. The first one is the entire group, including family members, at the cookout. The second one is the more intrepid group half way along the Lost Canyon Trail at Sheperd’s Falls. Thanks for Jie and Dan for organizing.

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Jason wins poster award at BMG XI

Jason won a poster award at the BMG XI, the 11th International Conference on Bulk Metallic Glasses for his poster “Medium-Range Structure of Zr-Cu-Al Bulk Metallic Glasses from Structure Optimization Based on Fluctuation Microscopy”. Congratulations, Jason!

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Electron correlation microscopy wins best paper award!

Li and Pei’s paper on electron correlation microscopy has won the Best Techniques and Instrumentation Paper in the journal Microscopy and Microanalysis for 2016.  Congratulations to Li and Pei for this well-deserved recognition of their excellent work!

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Paper on BN and graphene growth

Ashutosh has contributed to a paper demonstrating layer-by-layer controlled growth of h-BN on Co and h-BN / graphene heterostructures, which has appeared in Langmuir.

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New paper on black spot defects in SiC

Yizhang and Li contributed to a paper on correlations between black spot defects (small point defect clusters) and swelling in irradiated SiC, which has just appeared in Journal of Nuclear Materials.

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